EE 539B
Physics and Modeling of VLSI Fabrication
Winter Quarter 2001
Tuesday, Thursday 9:30-11:30am
Mechanical Engineering Building (MEB) 234
Instructor: Scott Dunham
Office: EE 218
Phone: 543-2189
E-mail: dunham@ee.washington.edu
Office hours: TBA
This is a new course to be offered for the second time Winter Quarter
2001 under the EE 539 label (Advanced Topics in Solid-State
Electronics). A proposal is in the works to make it a regular course
offering crosslisted in EE and MSE. The course is focused on
understanding CMOS technology at the current state-of-the-art and
beyond, and will provide the physical background behind modern VLSI
technology leading to an understanding of process interactions and
process integration. Process simulation using commercial TCAD tools
will be used extensively to illustrate and explore the technology. A
simulation project will be required along with a midterm, final and
homeworks (which will also have simulation problems).
Target Audience: Graduate students and advanced undergraduates
in EE, materials science, physics, chemical engineering, mechanical
engineering, chemistry, etc. interested in Microtechology and/or VLSI CAD.
Course Description: Physics of VLSI fabrication technology,
with emphasis on process modeling and simulation. CMOS process
sequences, point defects and diffusion, ion implantation and
annealing, film growth kinetics, deposition and etching, advanced
photolithography techniques. Process interactions and process
integration. Extensive use of process simulation software for both
class examples and assignments. 4 class. 4 cr.
Text: Silicon VLSI Technology: Plummer, Deal and Griffin
Prerequisites:
EE 482 (Semiconductor Devices) should have
familiarity with basic operation of MOS devices,
EE 486
(Fundamentals of Integrated Circuit Technology) or equivalent
exposure to basics of photolithography and diffusion/reaction problems,
or consent of instructor
-
Homeworks (Winter 2001)
Supplementary Reading
- A review paper on dopant diffusion:
``Modeling of Dopant Diffusion in Silicon,'' Scott T. Dunham, Alp
H. Gencer and Srinivasan Chakravarthi, IEICE
Trans. Electron. E82C, 800 (1999). [invited]
[ PDF ]
Notes associated with text by Plummer, Deal and Griffin
Exams