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The laboratory is one of the most important parts of this
course. A laboratory handbook is available to help
guide you through this. The contents of the handbook
are given below.
Each of the eight chapters can be downloaded as a pdf
document from this website. These links are at the
bottom of this page.
Note that not all of the procedures are to be done for
each experiment! For this quarter, the experiments
to be performed in each of the procedures are shown below,
along with the week of the quarter in which each
experiment occurs:
Mar. 31, Week 1: No laboratory.
Apr. 07, Week 2: Experiment E0: Procedures: 1, 2, 6, 7, 8 (NOTE: E0 is NOT handed in for grading.)
Apr. 14, Week 3: Experiment E1: Procedures: 1, 2, 3, 5, 6, 7
Apr. 21, Week 4: Experiment E2: Procedures: 1, 2, 4, 5, 6, 7
Apr. 28, Week 5: Experiment E3: Procedures: 1, 2, 3, 4, 5
May 5, Week 6: Experiment E4: Procedures: 1, 2, 4, 7, 12
May 12, Week 7: Experiment E5: Procedures: 2, 3, 6, 7, 12 (Procedure 7 is for extra credit)
May 19, Week 8: Final Project Description
May 26, Week 9: Final Project
June 2, Week 10: Final Project. Circuit demonstration to TA due on by Friday, June 6 at 5pm. Project report due on Tuesday, June 10 at 5pm.
Lab report instructions: Each individual must submit their own lab report. The lab write-ups must include the
answers to the questions for each procedure.
Additional data from the lab (i.e. sketches of the
oscilloscope measurements, voltage measurement data, etc.)
is encouraged but not required. It is encouraged to finish
the write-up during the lab session, however you may take up
to one week to complete the lab write-up. The lab reports are due on the same lab session in the following week. Normally, you should bring the report to your next lab and hand in to your TA. Late work will not be accepted. Please label your report with your name, the date of the lab session, and the names of your lab group members. This Template provides additional guidance on lab report expectations.
Experiment E0 is not graded, but the other five
Experiments, E1 - E5, together provide 60% of the
laboratory grade. Each experiment is thus worth 12%
of the overall laboratory score, and these grades are
assigned individually. Unlike the Experiments, which
are graded individually, a Design Project grade is
assigned to each group, and this provides the other 40% of
the laboratory grade. Thus, please insure that the
membership of the group is clearly stated on the final
project documentation.
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Contents |
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| I. |
Organization,
Hardware and Policies |
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1. Introduction
2. Calendar for the Quarter
3. Location and Time Slots
4. Laboratory Groups
5. Laboratory Grading
6. Electronic Instrumentation
7. Parts Kits
8. Replacement Parts
9. Laboratory Notebooks
10. How to Use the Experimental Procedures
11. Errata, Improvements, and Acknowledgements |
4
5
6
6
7
8
14
18
18
19
20 |
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| II. |
The Experiments |
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| 0. |
Laboratory
Preliminaries and Data Acquisition using LabVIEW |
(E0) |
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P1. Transformer voltages
P2. Internal resistance of the lab transformer
P3. Create a curve tracer with your oscilloscope!
P4. Oscilloscope input resistance
P5. When is a wire not a wire?
P6. Temperature measurement using LabVIEW and a DAQ
card
P7. Adding a Celsius to Fahrenheit conversion
P8. Saving the measurement results to spreadsheet
files |
E0.3
E0.5
E0.7
E0.9
E0.10
E0.12
E0.17
E0.18 |
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| 1. |
2-Terminal
Device Characteristics and Diode Characterization |
(E1) |
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P1. Measurement of diode reverse
leakage current
P2. Measurement of diode forward turn-on voltage
P3. Measurement of diode I-V characteristics using
the oscilloscope
P4. Effect of series and parallel resistances
P5. Measurement of diode I-V characteristics using
LabVIEW
P6. Measurement of a zener diode
P7. Characterization of a light-emitting diode (LED)
P8. Characterization of a photoconductive cell
P9. Diode switching transients |
E1.2
E1.4
E1.6
E1.9
E1.11
E1.16
E1.17
E1.18
E1.19 |
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| 2. |
Diode Circuit
Applications |
(E2) |
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P1. Voltage clipper circuits
P2. Voltage limiter circuits
P3. Precision half-wave rectifier
P4. Half-wave rectifier and capacitive filtering
P5. Full-wave bridge rectifier and capacitive
filtering
P6. Zener diode voltage regulator
P7. Voltage clamper circuits
P8. Voltage multiplier circuits |
E2.1
E2.4
E2.6
E2.7
E2.9
E2.11
E2.13
E2.14 |
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| 3. |
JFET and MOSFET
Characterization |
(E3) |
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P1. Discrete MOSFET lead, sex, and
mode identification
P2. Integrated MOSFET lead, sex, and mode
identification
P3. Measurement of a MOSFET using a LabVIEW curve
tracer
P4. Measurement of CMOS pairs using a LabVIEW curve
tracer
P5. Output conductance effects
P6. JFET gate lead, sex, and mode identification
P7. Measurement of a JFET using a LabVIEW curve
tracer
P8. JFET variable attenuator |
E3.3
E3.7
E3.10
E3.15
E3.18
E3.19
E3.20
E3.22 |
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| 4. |
FET Driver,
Load, and Switch Circuits |
(E4) |
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P1. E-mode MOSFET driver with resistor
load
P2. E-mode MOSFET driver with D-mode load device
P3. D-mode JFET driver with resistor load
P4. CMOS inverter circuit
P5. CMOS Schmitt trigger circuit
P6. Create a VTC curve tracer using LabVIEW and a
DAQ card
P7. CMOS inverter VTC measured using a LabVIEW curve
tracer
P8. 3-input CMOS NAND gate
P9. CMOS analog switch characteristics
P10. CMOS analog switch logic circuits
P11. Flying capacitor voltage inverter
P12. Voltage step-up switch-mode power supply
P13. Sample and hold gate |
E4.3
E4.6
E4.7
E4.8
E4.9
E4.11
E4.17
E4.19
E4.20
E4.23
E4.25
E4.27
E4.29 |
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| 5. |
CMOS Timing,
Logic, and Memory Circuits |
(E5) |
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P1. NAND and NOR gate truth table
verification
P2. Manual combinatorial logic analyzer using
LabVIEW
P3. Automatic combinatorial logic analyzer using
LabVIEW
P4. Non-latching monostable circuit
P5. Latching monostable circuit
P6. CMOS square wave oscillator
P7. Logic function implementation design
P8. Hardwired D-type flip-flop
P9. Asynchronous frequency divider circuits
P10. Synchronous finite state machine
P11. Push-on/push-off circuit
P12. CMOS ring oscillator |
E5.2
E5.6
E5.9
E5.12
E5.14
E5.16
E5.18
E5.19
E5.20
E5.22
E5.25
E5.27 |
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| III. |
The Design
Project: |
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Information and
Guidelines |
(D1) |
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1. Overview of Electronic Circuit
Design
2. Design Project Guidelines
3. Design Project Documentation |
D1.1
D1.3
D1.4 |
Download the EE-331 Laboratory Handbook:
I. Organization,
Hardware, and Policies (146 kB pdf)
II. The Experiments:
0. Experiment-0:
Laboratory Preliminaries and Data Acquisition using
LabVIEW (227 kB pdf) LabVIEW 7.1 VIs for Experiment-0
(56 kB pdf)
1. Experiment-1:
2-Terminal Device Characteristics and Diode
Characterization (298 kB pdf) LabVIEW 7.1 VIs for Experiment-1
(213 kB pdf)
2. Experiment-2:
Diode Circuit Applications (70 kB pdf)
3. Experiment-3:
JFET and MOSFET Characterization (404 kB pdf) LabVIEW 7.1 VIs for Experiment-3
(324 kB pdf)
4. Experiment-4:
FET Driver, Load, and Switch Circuits (534 kB pdf) LabVIEW 7.1 VIs for Experiment-4
(83 kB pdf)
5. Experiment-5:
CMOS Timing, Logic, and Memory Circuits (388 kB pdf)
LabVIEW 7.1 VIs for Experiment-5
(189 kB pdf)
III. The
Design Project Information and Guidelines (24 kB
pdf)
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